Measurements and Testbenches

Measure and verify gain, noise figure, and intercept point

Measurement of properties such as gain, noise figure, and intercept points (IPs) in RF systems is crucial to the system design and analysis. Such measurements are accomplished by placing a device under test (DUT) in a testbench. Use the testbenches blocks to measure RF properties and verify the response of the DUT.

Blocks

传感器获得Testbench	Measures transducer gain of system
Noise Figure Testbench	Measures noise figure of system
OIP3 Testbench	Measure output third intercept point of system
IIP3 Testbench	Measure input third intercept point of system
OIP2 Testbench	Measure output second intercept point of system
IIP2 Testbench	Measure input second intercept point of system
S-Parameter Testbench	Measure S-parameters of system

Featured Examples

Validating IP2/IP3 Using Complex Signals

Use the RF Blockset™ Circuit Envelope library to run a two-tone experiment that measures the second- and third-order intercept points of an amplifier. The model computes the intercept points of the amplifier from the modulated signal power measured on each carrier, verifying the behavior of the RF Blockset system. These values are confirmed using the RF Budget Analyzer app and a measurement testbench.

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Spot Noise Data in Amplifiers and Effects on Measured Noise Figure

A test bench model to describe the noise introduced by a 2-port device.

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Analysis of Frequency Response of RF System

Uses a few techniques to calculate the steady-state frequency response for a filter-based RF system built from RF Blockset™ Circuit Envelope library blocks. The first technique performs static analysis (harmonic balance) on a circuit comprising of inductors and capacitors. The second technique does time domain simulation using a similar circuit built with the Filter library block. The third technique facilitates small-signal analysis to obtain the frequency response of a filtering system that exhibits nonlinearity at a given operation point. This example helps you validate a circuit envelope model using a static analysis in the frequency domain, a time domain simulation, and small signal analysis in cases where the system exhibits non-linearity.

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Measure S-Parameter of Nonlinear System

Use the S-Parameter Testbench block to measure the S-parameters of a nonlinear system. The system shown here includes a device under test (DUT) with a linear filter followed by a nonlinear amplifier. The system allows an external steady state input that is switched off initially. When the DUT is nonlinear, the stimulus signal created in the S-Parameter Testbench block must be small enough to operate in the linear region.

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